Shrestha, P.
, Cheung, K.
, Ryan, J.
, Campbell, J.
and Baumgart, H.
(2014),
Fast-Capacitance for Advanced Device Characterization, 2012 IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf Lake, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914753
(Accessed September 16, 2024)