Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Fast-Capacitance for Advanced Device Characterization

Published

Author(s)

Pragya R. Shrestha, Kin P. Cheung, Jason T. Ryan, Jason P. Campbell, Helmut Baumgart

Abstract

Fast-CV measurements are frequently being used to study transient phenomena associated with advanced devices. In this study, we show that many artifacts plague this measurement and then provide a proper method to legitimize fast-CV measurements as trustworthy. We show a remarkably accurate correspondence between a complete fast CV measurement, from accumulation to inversion, and a conventional CV measurement on the same device. The results distinguish fast-CV as a powerful tool for device characterization and reliability measurements.
Proceedings Title
2012 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 13-17, 2013
Conference Location
Fallen Leaf Lake, CA
Conference Title
2012 IEEE International Integrated Reliability Workshop

Citation

Shrestha, P. , Cheung, K. , Ryan, J. , Campbell, J. and Baumgart, H. (2014), Fast-Capacitance for Advanced Device Characterization, 2012 IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf Lake, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914753 (Accessed August 10, 2022)
Created March 3, 2014, Updated February 19, 2017