Lee, Y.
(1990),
On Extending the Standard for the Exchange of Product Data to Represent Two-Dimensional Apparel Pattern Pieces, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.4358
(Accessed July 26, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
On Extending the Standard for the Exchange of Product Data to Represent Two-Dimensional Apparel Pattern Pieces
Published
Author(s)
Abstract
An Apparel Pattern Information Model (APIM) is introduced to demonstrate the feasibility of extending the emerging international Standard for the Exchange of Product Data (STEP) to include the exchange of apparel pattern data. This paper focuses on a representation of two- dimensional (flat) patterns. We show how this representation is capable of capturing the same information that can be expressed in one widely-used, but proprietary, format.Citation
NIST Interagency/Internal Report (NISTIR) - 4358
Report Number
4358
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
apparel pattern data, dimensional patterns, PDES, STEP
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1990, Updated November 10, 2018