On Extending the Standard for the Exchange of Product Data to Represent Two-Dimensional Apparel Pattern Pieces
Yung-Tsun T. Lee
An Apparel Pattern Information Model (APIM) is introduced to demonstrate the feasibility of extending the emerging international Standard for the Exchange of Product Data (STEP) to include the exchange of apparel pattern data. This paper focuses on a representation of two- dimensional (flat) patterns. We show how this representation is capable of capturing the same information that can be expressed in one widely-used, but proprietary, format.
On Extending the Standard for the Exchange of Product Data to Represent Two-Dimensional Apparel Pattern Pieces, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.4358
(Accessed December 7, 2023)