Sisco, E.
, Demovanville, L.
and Gillen, J.
(2013),
Evaluation of C60 Secondary Ion Mass Spectrometry for the Chemical Analysis and Imaging of Fingerprints, Forensic Science International
(Accessed October 10, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Evaluation of C60 Secondary Ion Mass Spectrometry for the Chemical Analysis and Imaging of Fingerprints
Published
Author(s)
, Leonard Demovanville,
Abstract
The feasibility of using C60 Cluster Primary Ion Bombardment Secondary Ion Mass Spectrometry (C60 SIMS) for the analysis of the chemical composition of fingerprints is evaluated. It was found that C60 SIMS could be used to detect and image the spatial localization of a number of sebaceous and eccrine components in fingerprints. These analyses were also found to not be hindered by the use of common latent print powder development techniques. Finally, the ability to monitor the depth distribution of fingerprint constituents was found to be possible a capability which has not been shown using other chemical imaging techniques. This paper illustrates a number of strengths and potential weaknesses of C60 SIMS as an additional or complimentary technique for the chemical analysis of fingerprints.Citation
Forensic Science International
Pub Type
Journals
Keywords
chemical analysis, latent fingerprints, secondary ion mass spectrometry
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 22, 2013, Updated February 19, 2017