Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

Published

Author(s)

Xiaohong Gu, Mark R. VanLandingham, Michael J. Fasolka, Jonathan W. Martin, J Y. Jean, Tinh Nguyen
Conference Location
Myrtle Beach, SC
Conference Title
Proceedings of the 26th Annual Meeting of the Adhesion Society

Keywords

Atomic Force Microscopy (AFM), Combinatorial and THE Methods, Microscopy, Nanostructured Materials, humidity, relative humidity (RH)

Citation

Gu, X. , VanLandingham, M. , Fasolka, M. , Martin, J. , Jean, J. and Nguyen, T. (2003), Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity, Proceedings of the 26th Annual Meeting of the Adhesion Society, Myrtle Beach, SC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853857 (Accessed May 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2002, Updated October 12, 2021