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Embedded Decoupling Capacitance Materials Characterization

Published

Author(s)

Jan Obrzut

Abstract

The dielectric constant of the embedded capacitance materials was measured in the frequency range from 100 Hz to 5 GHz. The testing included evaluation of the capacitance density, leakage current, and the effect of HAST on the capacitance. A test specimen and test procedure have been designed for dielectric characterization of the embedded capacitance materials and used as common test vehicles to compare dielectric constant of High K films that have recently been developed by the industry. The objectives of NIST involvement in this NCMS-led project was to develop and evaluate a test method suitable for dielectric permittivity of high K polymer composite films that covers broader functional frequency range including the microwave.
Citation
Embedded Decoupling Capacitance Project
Volume
91

Keywords

capacitor, dielectric constant, electronic, embedded, frequency, measurement, polymer, test pattern, thin film

Citation

Obrzut, J. (2000), Embedded Decoupling Capacitance Materials Characterization, Embedded Decoupling Capacitance Project, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851697 (Accessed May 23, 2024)

Issues

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Created December 1, 2000, Updated February 19, 2017