Obrzut, J.
(2000),
Embedded Decoupling Capacitance Materials Characterization, Embedded Decoupling Capacitance Project, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851697
(Accessed September 15, 2024)
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Embedded Decoupling Capacitance Materials Characterization
Published
Author(s)
Abstract
The dielectric constant of the embedded capacitance materials was measured in the frequency range from 100 Hz to 5 GHz. The testing included evaluation of the capacitance density, leakage current, and the effect of HAST on the capacitance. A test specimen and test procedure have been designed for dielectric characterization of the embedded capacitance materials and used as common test vehicles to compare dielectric constant of High K films that have recently been developed by the industry. The objectives of NIST involvement in this NCMS-led project was to develop and evaluate a test method suitable for dielectric permittivity of high K polymer composite films that covers broader functional frequency range including the microwave.Citation
Embedded Decoupling Capacitance Project
Volume
91
Pub Type
Others
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Keywords
capacitor, dielectric constant, electronic, embedded, frequency, measurement, polymer, test pattern, thin film
Citation
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Created December 1, 2000, Updated February 19, 2017