Holloway, C.
, Simons, M.
, Gordon, J.
, Raithel, G.
and Anderson, D.
(2017),
Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923077
(Accessed October 4, 2024)