TY  - JOUR
AU  - Christopher Holloway
AU  - Matthew Simons
AU  - Joshua Gordon
AU  - Georg Raithel
AU  - dave Anderson
C2  - Journal of Applied Physics
DA  - 2017-05-24
LA  - en
PB  - Journal of Applied Physics
PY  - 2017
TI  - Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923077
ER  -