@article{233351,
  author = {Christopher Holloway and Matthew Simons and Joshua Gordon and Georg Raithel and dave Anderson},
  title = {Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor},
  year = {2017},
  month = {2017-05-24},
  publisher = {Journal of Applied Physics},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=923077},
  language = {en},
}