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The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Published
Author(s)
Donald R. Larson, Nicholas Paulter
Abstract
The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except for values from about -50 mV to 50 mV. Slight changes in bandwidth were observed for offset voltages from -250 mV to 250 mV with significant bandwidth loss observed for offset voltages outside this range.
Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Larson, D.
and Paulter, N.
(2000),
The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method, Proc. IEEE Instrumentation and Technology Conference (IMTC), Baltimore, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5695
(Accessed October 15, 2025)