Larson, D.
and Paulter, N.
(2000),
The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method, Proc. IEEE Instrumentation and Technology Conference (IMTC), Baltimore, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5695
(Accessed December 14, 2024)
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The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Published
Author(s)
,
Abstract
The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except for values from about -50 mV to 50 mV. Slight changes in bandwidth were observed for offset voltages from -250 mV to 250 mV with significant bandwidth loss observed for offset voltages outside this range.Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Volume
3
Conference Dates
May 1-4, 2000
Conference Location
Baltimore, MD
Pub Type
Conferences
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Keywords
sampling, oscilloscope, gigahertz, nose-to-nose, kick-out, pulse
Citation
Issues
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Created April 30, 2000, Updated October 12, 2021