Gao, G.
, Lehan, J.
and Griesmann, U.
(2008),
Dual-CGH Interferometry Test for X-Ray Mirror Mandrels, Optical Measurement Systems for Industrial Inspection, Muenchen, DE, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902515
(Accessed October 11, 2025)
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Dual-CGH Interferometry Test for X-Ray Mirror Mandrels
Published
Author(s)
, John Lehan,
Abstract
We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces.Proceedings Title
Optical Measurement Systems for Industrial Inspection
Volume
7389
Conference Dates
June 15-18, 2009
Conference Location
Muenchen, DE
Conference Title
SPIE Europe Optical Metrology
Pub Type
Conferences
Download Paper
Keywords
Interferometry, optical test, computer-generated hologram, x-ray telescope optics
Citation
Issues
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Created June 14, 2008, Updated October 12, 2021