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Dual-CGH Interferometry Test for X-Ray Mirror Mandrels



Guangjun Gao, John Lehan, Ulf Griesmann


We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces.
Proceedings Title
Optical Measurement Systems for Industrial Inspection
Conference Dates
June 15-18, 2009
Conference Location
Muenchen, DE
Conference Title
SPIE Europe Optical Metrology


Interferometry, optical test, computer-generated hologram, x-ray telescope optics


Gao, G. , Lehan, J. and Griesmann, U. (2008), Dual-CGH Interferometry Test for X-Ray Mirror Mandrels, Optical Measurement Systems for Industrial Inspection, Muenchen, DE, [online], (Accessed July 17, 2024)


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Created June 14, 2008, Updated October 12, 2021