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Dual-CGH Interferometry Test for X-Ray Mirror Mandrels

Published

Author(s)

Guangjun Gao, John Lehan, Ulf Griesmann

Abstract

We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are described. The application illustrates the advantage of dual-CGH tests for the complete metrology of precise optical surfaces.
Proceedings Title
Optical Measurement Systems for Industrial Inspection
Volume
7389
Conference Dates
June 15-18, 2009
Conference Location
Muenchen, DE
Conference Title
SPIE Europe Optical Metrology

Keywords

Interferometry, optical test, computer-generated hologram, x-ray telescope optics

Citation

Gao, G. , Lehan, J. and Griesmann, U. (2008), Dual-CGH Interferometry Test for X-Ray Mirror Mandrels, Optical Measurement Systems for Industrial Inspection, Muenchen, DE, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902515 (Accessed February 24, 2024)
Created June 14, 2008, Updated October 12, 2021