TY - CONF AU - Guangjun Gao AU - John Lehan AU - Ulf Griesmann C2 - Optical Measurement Systems for Industrial Inspection, Muenchen, DE DA - 2008-06-15 00:06:00 LA - en M1 - 7389 PB - Optical Measurement Systems for Industrial Inspection, Muenchen, DE PY - 2008 TI - Dual-CGH Interferometry Test for X-Ray Mirror Mandrels UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902515 ER -