Horst, J.
, Kramer, T.
, Stouffer, K.
, Falco, J.
, Huang, H.
, Proctor, F.
and Wavering, A.
(2002),
Distributed testing of a device-level interface specification for a metrology system:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6851
(Accessed October 6, 2024)
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Distributed testing of a device-level interface specification for a metrology system:
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- NIST IR 6851
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NIST IR 6851
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NIST Pubs
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Created January 1, 2002, Updated May 20, 2023