@misc{1141311,
  author = {John Horst and Thomas Kramer and Keith Stouffer and Joseph Falco and Hui-Min Huang and Frederick Proctor and Albert Wavering},
  title = {Distributed testing of a device-level interface specification for a metrology system:},
  year = {2002},
  month = {2002-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.IR.6851},
  language = {en},
}