TY  - GEN
AU  - John Horst
AU  - Thomas Kramer
AU  - Keith Stouffer
AU  - Joseph Falco
AU  - Hui-Min Huang
AU  - Frederick Proctor
AU  - Albert Wavering
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2002-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6851
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2002
TI  - Distributed testing of a device-level interface specification for a metrology system:
ER  -