Distributed Testing of a Device-Level Interface Specification for a Metrology System
Joseph Falco, John A. Horst, Hui-Min Huang, Thomas Kramer, Frederick M. Proctor, Keith A. Stouffer, Albert J. Wavering
A test suite for an key interface within a dimensional measuring system (coordinate measuring machine or CMM) is presented. The test suite consists of test procedures, test definitions, and various testing utilities. A real-time, distributed test utilizing the test suite has been performed and is described.
conformance test, coordinate measuring machine, distributed testing, interface specifications, metrology, object-oriented, real-time systems, test suite, validation test
, Horst, J.
, Huang, H.
, Kramer, T.
, Proctor, F.
, Stouffer, K.
and Wavering, A.
Distributed Testing of a Device-Level Interface Specification for a Metrology System, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6851, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=821682
(Accessed December 8, 2023)