A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns

Michael W. Cresswell; D. Khera; Loren W. Linholm; C. E. Schuster

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PUBLICATIONS

A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns

Published

August 1, 1992

Author(s)

Michael W. Cresswell, D. Khera, Loren W. Linholm, C. E. Schuster

Citation

IEEE Transactions on Semiconductor Manufacturing

Volume

Issue

Pub Type

Journals

Citation

Cresswell, M. , Khera, D. , Linholm, L. and Schuster, C. (1992), A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns, IEEE Transactions on Semiconductor Manufacturing (Accessed May 7, 2026)

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Created July 31, 1992, Updated October 12, 2021

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