Cresswell, M.
, Khera, D.
, Linholm, L.
and Schuster, C.
(1992),
A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns, IEEE Transactions on Semiconductor Manufacturing
(Accessed October 13, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns
Published
Author(s)
, D. Khera, , C. E. Schuster
Citation
IEEE Transactions on Semiconductor Manufacturing
Volume
5
Issue
3
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 31, 1992, Updated October 12, 2021