TY - JOUR AU - Cresswell, Michael AU - Khera, D. AU - Linholm, Loren AU - Schuster, C. C2 - IEEE Transactions on Semiconductor Manufacturing DA - 1992-08-01 00:08:00 LA - en M1 - 5 PB - IEEE Transactions on Semiconductor Manufacturing PY - 1992 TI - A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns ER -