TY  - JOUR
AU  - Cresswell, Michael
AU  - Khera, D.
AU  - Linholm, Loren
AU  - Schuster, C.
C2  - IEEE Transactions on Semiconductor Manufacturing
DA  - 1992-08-01 00:08:00
LA  - en
M1  - 5
PB  - IEEE Transactions on Semiconductor Manufacturing
PY  - 1992
TI  - A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns
ER  -