Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films

Published

Author(s)

Vivek M. Prabhu, B D. Vogt, Wen-Li Wu, Eric K. Lin, Jack F. Douglas, Sushil K. Satija, D L. Goldfarb, H Ito

Abstract

The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution.Wefind substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.
Citation
Langmuir
Volume
21
Issue
15

Keywords

aqueous base, dissolution, lithography, nanotechnology, neutron reflectivity, photoresist, polyelectrolyte, swelling, thin film

Citation

Prabhu, V. , Vogt, B. , Wu, W. , Lin, E. , Douglas, J. , Satija, S. , Goldfarb, D. and Ito, H. (2005), Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films, Langmuir, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852397 (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 19, 2005, Updated February 19, 2017