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Direct Experimental Evidence for a Dominant Hole Trapping Center in SIMOX Oxides, Extended Abstract

Published

Author(s)

J. F. Conley, Patrick M. Lenahan, Peter Roitman
Proceedings Title
Proc., 1990 IEEE SOS/SOI Technology Conference
Conference Dates
October 2-4, 1990
Conference Location
Key West, FL, USA

Citation

Conley, J. , Lenahan, P. and Roitman, P. (1990), Direct Experimental Evidence for a Dominant Hole Trapping Center in SIMOX Oxides, Extended Abstract, Proc., 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA (Accessed July 18, 2024)

Issues

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Created December 30, 1990, Updated October 12, 2021