Conley, J.
, Lenahan, P.
and Roitman, P.
(1990),
Direct Experimental Evidence for a Dominant Hole Trapping Center in SIMOX Oxides, Extended Abstract, Proc., 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA (Accessed April 30, 2026)
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Direct Experimental Evidence for a Dominant Hole Trapping Center in SIMOX Oxides, Extended Abstract
Published
Author(s)
J. F. Conley, Patrick M. Lenahan,
Proceedings Title
Proc., 1990 IEEE SOS/SOI Technology Conference
Conference Dates
October 2-4, 1990
Conference Location
Key West, FL, USA
Pub Type
Conferences
Citation
Issues
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Created December 30, 1990, Updated October 12, 2021