TY  - CONF
AU  - J. Conley
AU  - Patrick Lenahan
AU  - Peter Roitman
C2  - Proc., 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA
DA  - 1990-12-31 00:12:00
LA  - en
PB  - Proc., 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA
PY  - 1990
TI  - Direct Experimental Evidence for a Dominant Hole Trapping Center in SIMOX Oxides, Extended Abstract
ER  -