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PUBLICATIONS

Development of a Low-Profile High-Efficiency Microchannel-Plate Detector System for SEM Imaging and Metrology

Published

Author(s)

Michael T. Postek, William J. Keery, Nolan V. Frederick
Proceedings Title
Proc., Scanning 90
Conference Location
Mahwah, NJ, USA
Pub Type
Conferences

Citation

Postek, M. , Keery, W. and Frederick, N. (1990), Development of a Low-Profile High-Efficiency Microchannel-Plate Detector System for SEM Imaging and Metrology, Proc., Scanning 90, Mahwah, NJ, USA (Accessed October 22, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1990, Updated October 12, 2021
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