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PUBLICATIONS

Current Compliance Circuit to Improve Variation in ON State Characteristics and to Minimize RESET Current

Published

Author(s)

Pragya R. Shrestha, Adaku Ochia, Jason P. Campbell, Canute I. Vaz, Jihong Kim, Kin P. Cheung, Helmut Baumgart, Gary Harris

Abstract

The wide distribution of ON and OFF values and high SET current in resistive memory is attributed to the high current overshoot during the SET process. In this paper we show a circuit which is capable of precisely limiting the current during SET process. The circuit can achieve an overshoot free SET current as low as 20 µA within 500 ps. This results in less than 200 µA of device RESET current while maintaining a relatively large RON/ROFF ratio greater than 104.
Proceedings Title
ECS FAll Meeting Trasnsaction
Conference Dates
October 7-12, 2012
Conference Location
Honolulu, HI
Conference Title
ECS Fall Meeting 2012
Pub Type
Conferences
Semiconductors and Metrology

Citation

Shrestha, P. , Ochia, A. , Campbell, J. , Vaz, C. , Kim, J. , Cheung, K. , Baumgart, H. and Harris, G. (2012), Current Compliance Circuit to Improve Variation in ON State Characteristics and to Minimize RESET Current, ECS FAll Meeting Trasnsaction, Honolulu, HI (Accessed October 3, 2024)

Issues

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Created October 7, 2012, Updated February 19, 2017