Wilson, C.
and Blue, J.
(1984),
CSIR ::a two-dimensional finite element change-sheet model of MOSFET's including radiation-induced interface and oxide charge, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.84-2874R
(Accessed July 26, 2024)
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CSIR ::a two-dimensional finite element change-sheet model of MOSFET's including radiation-induced interface and oxide charge
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- NBS IR 84-2874R
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NBS IR 84-2874R
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NIST Pubs
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Created January 1, 1984, Updated May 19, 2023