TY  - GEN
AU  - Wilson, C L
AU  - Blue, J L
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1984-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.84-2874R
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1984
TI  - CSIR ::a two-dimensional finite element change-sheet model of MOSFET's including radiation-induced interface and oxide charge
ER  -