Swartzendruber, L.
(1964),
Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.199
(Accessed December 13, 2024)
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Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples:
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- NBS TN 199
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NBS TN 199
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NIST Pubs
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Created January 1, 1964, Updated May 19, 2023