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Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples:

Published

Author(s)

Lydon J Swartzendruber
Citation
- NBS TN 199
Report Number
NBS TN 199

Citation

Swartzendruber, L. (1964), Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.199 (Accessed December 8, 2023)
Created January 1, 1964, Updated May 19, 2023