TY - GEN AU - Lydon J Swartzendruber C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1964-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.TN.199 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1964 TI - Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples: ER -