Thurber, W.
, Ehrstein, J.
and Lowney, J.
(1990),
Comparison of High-Resistivity Measurements of Silicon by AC Impedance, DC Resistance, van der Pauw, and Four-Probe Methods, Extended Abstract, Extended Abstracts of the Electrochemical Society, Seattle, WA, USA
(Accessed May 10, 2025)
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Comparison of High-Resistivity Measurements of Silicon by AC Impedance, DC Resistance, van der Pauw, and Four-Probe Methods, Extended Abstract
Published
Author(s)
, ,
Proceedings Title
Extended Abstracts of the Electrochemical Society
Volume
90no2
Conference Dates
October 14-19, 1990
Conference Location
Seattle, WA, USA
Pub Type
Conferences
Citation
Issues
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Created December 30, 1990, Updated October 12, 2021