@conference{767556,
  author = {W. Thurber and James Ehrstein and J Lowney},
  title = {Comparison of High-Resistivity Measurements of Silicon by AC Impedance, DC Resistance, van der Pauw, and Four-Probe Methods, Extended Abstract},
  year = {1990},
  number = {90no2},
  month = {1990-12-31 00:12:00},
  publisher = {Extended Abstracts of the Electrochemical Society, Seattle, WA, USA},
  language = {en},
}