Klein, E.
, Ramirez, W.
and Hall, J.
(2001),
A common-path heterodyne interferometer for surface profiling in microelectronic fabrication, Review of Scientific Instruments
(Accessed December 15, 2024)
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A common-path heterodyne interferometer for surface profiling in microelectronic fabrication
Published
Author(s)
E J. Klein, W F. Ramirez,
Citation
Review of Scientific Instruments
Volume
72
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2000, Updated October 12, 2021