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Charge Pumping for Reliability Characterization and Testing of Nanoelectronic Devices

Published

Author(s)

Jason T. Ryan, Jason P. Campbell, John S. Suehle, Kin P. Cheung
Citation
Characterization and Metrology for Nanoelectronics and Nanostructures
Publisher Info
Pan Stanford Publishing, Boca Raton, FL

Citation

Ryan, J. , Campbell, J. , Suehle, J. and Cheung, K. (2016), Charge Pumping for Reliability Characterization and Testing of Nanoelectronic Devices, Characterization and Metrology for Nanoelectronics and Nanostructures, Pan Stanford Publishing, Boca Raton, FL (Accessed July 6, 2022)
Created September 14, 2016, Updated February 19, 2017