@inbook{218961, author = {Jason Ryan and Jason Campbell and John Suehle and Kin Cheung}, title = {Charge Pumping for Reliability Characterization and Testing of Nanoelectronic Devices}, year = {2016}, month = {2016-09-14}, publisher = {Characterization and Metrology for Nanoelectronics and Nanostructures, Pan Stanford Publishing, Boca Raton, FL}, language = {en}, }