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PUBLICATIONS

Characterization of UV-Induced Radiation Damage in Si-based Photodiodes

Published

Author(s)

R Gupta, Keith R. Lykke, Ping-Shine Shaw, J L. Dehmer
Citation
SPIE
Volume
3818
Pub Type
Journals

Citation

Gupta, R. , Lykke, K. , Shaw, P. and Dehmer, J. (1999), Characterization of UV-Induced Radiation Damage in Si-based Photodiodes, SPIE (Accessed April 30, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1999, Updated February 17, 2017