Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Characterization of UV-Induced Radiation Damage in Si-based Photodiodes

Published

Author(s)

R Gupta, Keith R. Lykke, Ping-Shine Shaw, J L. Dehmer
Citation
SPIE
Volume
3818

Citation

Gupta, R. , Lykke, K. , Shaw, P. and Dehmer, J. (1999), Characterization of UV-Induced Radiation Damage in Si-based Photodiodes, SPIE (Accessed August 14, 2022)
Created January 1, 1999, Updated February 17, 2017