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Characterization of UV-Induced Radiation Damage in Si-based Photodiodes

Published

Author(s)

R Gupta, Keith R. Lykke, Ping-Shine Shaw, J L. Dehmer
Citation
SPIE
Volume
3818

Citation

Gupta, R. , Lykke, K. , Shaw, P. and Dehmer, J. (1999), Characterization of UV-Induced Radiation Damage in Si-based Photodiodes, SPIE (Accessed June 25, 2024)

Issues

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Created January 1, 1999, Updated February 17, 2017