Swartzendruber, L.
(1964),
Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples.:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.241
(Accessed October 6, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples.:
Published
Author(s)
Citation
- NBS TN 241
Report Number
NBS TN 241
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1964, Updated May 19, 2023