TY  - GEN
AU  - Swartzendruber, Lydon J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1964-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.241
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1964
TI  - Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples.:
ER  -