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PUBLICATIONS

Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures

Published

Author(s)

Ana Stevanovic, Jeyavel Velmurugan, Feng Yi, David A. LaVan, Andrei Kolmakov

Abstract

We developed a versatile environmental cell for ambient pressure scanning electron microscopy (SEM) technique to study the interplay between surface reactivity and electronic properties of metal oxide nanowires such as SnO2, TiO2 and ZnO. We tested electron beam induced current (EBIC) imaging techniques on a nanowire in the presence of oxidizing or reducing gas at atmospheric pressure. The contract variations in the atmospheric versus in vacuum EBIC images were interpreted in terms of adsorbate modulated near electrode Schottky barriers
Volume
22
Issue
S3
Conference Dates
July 24-28, 2016
Conference Location
Columbus, OH, US
Conference Title
Microscopy and Microanalysis
Pub Type
Conferences

Download Paper

https://doi.org/10.1017/S1431927616007303
Local Download

Keywords

EBIC, atmospheric pressure SEM, nanowires
Nanometrology and Nanomaterials

Citation

Stevanovic, A. , Velmurugan, J. , Yi, F. , LaVan, D. and Kolmakov, A. (2016), Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures, Microscopy and Microanalysis, Columbus, OH, US, [online], https://doi.org/10.1017/S1431927616007303, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920663 (Accessed April 19, 2024)

Created July 24, 2016, Updated April 6, 2022