Stevanovic, A.
, Velmurugan, J.
, Yi, F.
, LaVan, D.
and Kolmakov, A.
(2016),
Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures, Microscopy and Microanalysis, Columbus, OH, US, [online], https://doi.org/10.1017/S1431927616007303, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920663
(Accessed December 14, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures
Published
Author(s)
, , , ,
Abstract
We developed a versatile environmental cell for ambient pressure scanning electron microscopy (SEM) technique to study the interplay between surface reactivity and electronic properties of metal oxide nanowires such as SnO2, TiO2 and ZnO. We tested electron beam induced current (EBIC) imaging techniques on a nanowire in the presence of oxidizing or reducing gas at atmospheric pressure. The contract variations in the atmospheric versus in vacuum EBIC images were interpreted in terms of adsorbate modulated near electrode Schottky barriersVolume
22
Issue
S3
Conference Dates
July 24-28, 2016
Conference Location
Columbus, OH, US
Conference Title
Microscopy and Microanalysis
Pub Type
Conferences
Download Paper
Keywords
EBIC, atmospheric pressure SEM, nanowires
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 24, 2016, Updated April 6, 2022