TY  - CONF
AU  - Ana Stevanovic
AU  - Jeyavel Velmurugan
AU  - Feng Yi
AU  - David LaVan
AU  - Andrei Kolmakov
C2  - Microscopy and Microanalysis, Columbus, OH, US
DA  - 2016-07-24 04:07:00
DO  - https://doi.org/10.1017/S1431927616007303
LA  - en
M1  - 22
PB  - Microscopy and Microanalysis, Columbus, OH, US
PY  - 2016
TI  - Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920663
ER  -