@conference{871221,
  author = {Ana Stevanovic and Jeyavel Velmurugan and Feng Yi and David LaVan and Andrei Kolmakov},
  title = {Bridging the Pressure Gap in Electron Beam Induced Current Microscopy: Imaging Charge Transport in Metal Oxide Nanowires under Atmospheric Pressures},
  year = {2016},
  number = {22},
  month = {2016-07-24 04:07:00},
  publisher = {Microscopy and Microanalysis, Columbus, OH, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920663},
  doi = {https://doi.org/10.1017/S1431927616007303},
  language = {en},
}