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An Automated Reverse-Bias Second-Breakdown Transistor Tester

Published

Author(s)

David W. Berning
Proceedings Title
Proc., Applied Power Electronics Conference and Exposition
Issue
6
Conference Dates
March 10-15, 1991
Conference Location
Dallas, TX

Citation

Berning, D. (1991), An Automated Reverse-Bias Second-Breakdown Transistor Tester, Proc., Applied Power Electronics Conference and Exposition, Dallas, TX (Accessed April 20, 2024)
Created December 31, 1991, Updated February 17, 2017