Berning, D.
(1991),
An Automated Reverse-Bias Second-Breakdown Transistor Tester, Proc., Applied Power Electronics Conference and Exposition, Dallas, TX (Accessed August 23, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
An Automated Reverse-Bias Second-Breakdown Transistor Tester
Published
Author(s)
Proceedings Title
Proc., Applied Power Electronics Conference and Exposition
Issue
6
Conference Dates
March 10-15, 1991
Conference Location
Dallas, TX
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1991, Updated February 17, 2017