Berning, D.
(1991),
An Automated Reverse-Bias Second-Breakdown Transistor Tester, Proc., Applied Power Electronics Conference and Exposition, Dallas, TX
(Accessed March 14, 2026)
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An Automated Reverse-Bias Second-Breakdown Transistor Tester
Published
Author(s)
Proceedings Title
Proc., Applied Power Electronics Conference and Exposition
Issue
6
Conference Dates
March 10-15, 1991
Conference Location
Dallas, TX
Pub Type
Conferences
Citation
Issues
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Created December 31, 1991, Updated February 17, 2017