TY  - CONF
AU  - David Berning
C2  - Proc., Applied Power Electronics Conference and Exposition, Dallas, TX
DA  - 1991-12-31
LA  - en
PB  - Proc., Applied Power Electronics Conference and Exposition, Dallas, TX
PY  - 1991
TI  - An Automated Reverse-Bias Second-Breakdown Transistor Tester
ER  -