Atomic Spectral Tables for the Chandra X-Ray Observatory. Part II (Si vi - Si xii)

Published

June 1, 2004

Author(s)

Larissa Podobedova, Daniel E. Kelleher, Joseph Reader, Wolfgang L. Wiese

Abstract

Tables of critically compiled wavelengths, energy levels, line classifications, and transition probabilities are given for spectra of ionized silicon (Si VI - Si XII) in the region 25 to 170 . These tables provide data of interest for the Emission Line Project in support of analyses of astronomical data from the Chandra X-ray Observatory. They will also be useful for the diagnostics of plasmas encountered in fusion energy research. The transition probabilities were obtained mainly from recent sophisticated calculations carried out with complex computer codes.

Citation

J. Phys. & Chem. Ref. Data (JPCRD) -

NIST Pub Series

J. Phys. & Chem. Ref. Data (JPCRD)

Pub Type

NIST Pubs

Keywords

far ultraviolet, Si IX, Si VI, Si VII, Si VIII, Si XI, Si XII, silicon, soft x-rays

Citation

Podobedova, L. , Kelleher, D. , Reader, J. and Wiese, W. (2004), Atomic Spectral Tables for the Chandra X-Ray Observatory. Part II (Si vi - Si xii), J. Phys. & Chem. Ref. Data (JPCRD), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 13, 2024)