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Atomic Spectral Tables for the Chandra X-Ray Observatory. Part II (Si vi - Si xii)



Larissa Podobedova, Daniel E. Kelleher, Joseph Reader, Wolfgang L. Wiese


Tables of critically compiled wavelengths, energy levels, line classifications, and transition probabilities are given for spectra of ionized silicon (Si VI - Si XII) in the region 25 to 170 . These tables provide data of interest for the Emission Line Project in support of analyses of astronomical data from the Chandra X-ray Observatory. They will also be useful for the diagnostics of plasmas encountered in fusion energy research. The transition probabilities were obtained mainly from recent sophisticated calculations carried out with complex computer codes.
J. Phys. & Chem. Ref. Data (JPCRD) -


far ultraviolet, Si IX, Si VI, Si VII, Si VIII, Si XI, Si XII, silicon, soft x-rays


Podobedova, L. , Kelleher, D. , Reader, J. and Wiese, W. (2004), Atomic Spectral Tables for the Chandra X-Ray Observatory. Part II (Si vi - Si xii), J. Phys. & Chem. Ref. Data (JPCRD), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 18, 2024)


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Created June 1, 2004, Updated November 14, 2018