An Approximate Approach to Determining the Permittivity and Permeability near Lambda/2 Resonances in Transmission/Reflection Measurements
Sung Kim, James R. Baker-Jarvis
We present a simple and straightforward approximate approach to removing resonant artifacts that arise in the material parameters extracted near half-wavelength resonances that arise from transmission/reflection (T/R) measurements on low-loss materials. In order to determine material parameters near one such ʎ/2 resonance, by means of the 1st-order regressions for the input impedance of the sample-loaded transmission line, we approximate the characteristic impedance of the sample-loaded section that is, in turn, dependent either on the relative wave impedance in a coaxial transmission line or on the relative permeability in a rectangular waveguide case. The other material parameters are then found, supplemented with the refractive index obtained from the conventional T/R method. This method applies to both coaxial transmission line and rectangular waveguide measurements. Our approach is validated by use of S-parameters simulated for a low-loss magnetic material, and is also applied to determine the relative permittivity and permeability from S-parameters measured for nylon and lithium-ferrite samples. The results are discussed as compared to those from the well-known Nicolson-Ross-Weir (NRW) method and are experimentally compared to those from the Baker-Jarvis (BJ) method as well.
Proceeding of the Asia-Pacific Microwave Conference (PMC 2013)
and Baker-Jarvis, J.
An Approximate Approach to Determining the Permittivity and Permeability near Lambda/2 Resonances in Transmission/Reflection Measurements, Proceeding of the Asia-Pacific Microwave Conference (PMC 2013), Coex, Seoul, -1, [online], https://doi.org/10.2528/PIERB13121308
(Accessed December 9, 2023)