Galloway, K.
and Buehler, M.
(1976),
The application of test structures and test patterns to the development of radiation hardened integrated circuits ::a review, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.76-1093
(Accessed April 19, 2024)
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The application of test structures and test patterns to the development of radiation hardened integrated circuits ::a review
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Citation
- NBS IR 76-1093
Report Number
NBS IR 76-1093
Pub Type
NIST Pubs
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Created January 1, 1976, Updated May 19, 2023