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The application of test structures and test patterns to the development of radiation hardened integrated circuits ::a review

Published

Author(s)

K F Galloway, M G Buehler
Citation
- NBS IR 76-1093
Report Number
NBS IR 76-1093

Citation

Galloway, K. and Buehler, M. (1976), The application of test structures and test patterns to the development of radiation hardened integrated circuits ::a review, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.76-1093 (Accessed July 14, 2024)

Issues

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Created January 1, 1976, Updated May 19, 2023