@misc{1186446,
  author = {K F Galloway and M G Buehler},
  title = {The application of test structures and test patterns to the development of radiation hardened integrated circuits ::a review},
  year = {1976},
  month = {1976-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.IR.76-1093},
  language = {en},
}