Hebner, R.
, Kelley, E.
and Hagler, J.
(1983),
1981 annual report ::optical measurements for interfacial conduction and breakdown, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.82-2629
(Accessed April 20, 2024)
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1981 annual report ::optical measurements for interfacial conduction and breakdown
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Author(s)
, ,
Citation
- NBS IR 82-2629
Report Number
NBS IR 82-2629
Pub Type
NIST Pubs
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Citation
Created January 1, 1983, Updated May 19, 2023