TY  - GEN
AU  - R E Hebner
AU  - E F Kelley
AU  - J N Hagler
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1983-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.82-2629
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1983
TI  - 1981 annual report ::optical measurements for interfacial conduction and breakdown
ER  -