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NIST Pubs

NIST Measurement Services: Photometric Calibration

January 1, 1997

Author(s)

Yoshihiro Ohno

Information Technology Laboratory Technical Accomplishments 1996

January 1, 1997

Author(s)

Elizabeth B. Lennon, Shirley M. Radack

Heat Capacity of Liquids: Critical Review and Recommended Values - Monograph No. 6

January 1, 1997

Author(s)

M. Zabransky, Vlastimil Ruzicka, V. Majer, E. S. Domalski

Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring System

January 1, 1997

Author(s)

James E. Potzick

This document describes the physical characteristics of Standard Reference Material SRM 473, provides instructions for its use in calibrating optical photomask

Thermal Expansion of Long Slender Rods With Forced Convection Cooling Along the Rod Length

January 1, 1997

Author(s)

F Rudder

This report presents explicit analytical expressions for the thermal expansion of a rod with heat input at one end and forced convection cooling along the

RISQ: A Web-Based Tool for Referencing Information on Software Quality

January 1, 1997

Author(s)

C B. Weinstock, D Wallace

Towards Extended-Cavity Grating-Tuned Mid-Infrared Diode Laser Operation

January 1, 1997

Author(s)

M M{umlat}rtz, J. S. Wells, Leo W. Hollberg, T Zibrova, N Mackie, Z Feit

Transmission Filters with Measured Optical Density at 1064 nm Wavelength ?} - SRMs 2046, 2047, 2048, 2049, 2050, 2051

January 1, 1997

Author(s)

Z M. Zhang, Thomas R. Gentile, Alan L. Migdall, Raju V. Datla

Microwave Spectra of Molecules of Astrophysical Interest. XXIV: Methanol (CH₃OH and ¹³CH₃OH)

January 1, 1997

Author(s)

L H. Xu, Francis J. Lovas

Spectral Data for Highly Ionized Atoms: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Kr and Mo

January 1, 1997

Author(s)

T Shirai, J Sugar, Wolfgang L. Wiese

Technical Activities 1997-Chemical Science and Technology Laboratory

January 1, 1997

Author(s)

Hratch G. Semerjian, W Koch

This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and

Proceedings of the First Process Specification Language (PSL) Roundtable

January 1, 1997

Author(s)

Craig I. Schlenoff, Amy Knutilla, Steven R. Ray

On April, 1997, the Process Specification Language (PSL) Project held a Roundtable discussion at the National Institute of Standards and Technology (NIST). The

Development of Manufacturing Systems Models Using VRML

January 1, 1997

Author(s)

V Krishnamurthy, Michael Iuliano, Charles R. McLean

The System Integration for Manufacturing Applications (SIMA) Program is a major internal effort being undertaken at the National Institute of Standards and

A Repository of Designs for Process and Assembly Planning

January 1, 1997

Author(s)

William Regli, Daniel M Gaines

This paper provides an introduction to the Design, Planning and Assembly Repository available through the National Institute of Standards and Technology (NIST)

Metrology for Information Technology (IT)

January 1, 1997

Author(s)

Lisa Carnahan, M M. Gray, Michael Hogan, Ted Hopp, Jeffrey Horlick, Gordon E. Lyon, Elena R. Messina

The scope of this white paper is the testing or measuring of digital information technology (IT) systems attributes or proporties; the use of digitial IT

Cavity Coupling in Vertical-Cavity Semiconductor Lasers

January 1, 1997

Author(s)

D. T. Schaafsma, David H. Christensen

Relative Permittivity Measurement of Square Copper-Laminated Substrates Using the Full Sheet Resonance Technique

January 1, 1997

Author(s)

R L. Lewis

Benchmarking the Length Measurement Capabilities of the National Institute of Standards and Technology

January 1, 1997

Author(s)

Richard M. Silver, J Land, Jack A. Stone Jr., Ronald G. Dixson, Bryon S. Faust, James E. Potzick, Michael T. Postek, et al

A cross-section of measurements from the Precision Engineering Division within the National Institute of Standards and Technology is benchmarked against other

Performance of R-22 Alternative Refrigerants in a System With Cross-Flow and Counter-Flow Heat Exchangers (NISTIR 5945)

January 1, 1997

Author(s)

M H. Kim, Piotr A. Domanski, David Didion

This report presents results of performance tests of R-22 and four alternative fluids, R-134a, R-32/134a (30/70), R-407C, and R-410A, at operating conditions

Interlaboratory Comparison on High temperature Superconductor Critical-current Measurements

January 1, 1997

Author(s)

J A. Wiejaczka, Loren F. Goodrich

Report of External Review of NIST NAMT Project on Nanomanufacturing of Atom-Based Dimensional Standards

January 1, 1997

Author(s)

J Land, Dennis A. Swyt

This report summarizes a workshop held on August 15, 1996, which provided an opportunity to U.S. industry in distributed and virtual manufacturing technologies

Extension of the NIST AC-DC Difference Calibration Service for Current to 100 kHz

January 1, 1997

Author(s)

Joseph R. Kinard Jr., Thomas E. Lipe Jr., Clifton B. Childers

Electron Interactions with CCl2F2

January 1, 1997

Author(s)

Loucas G. Christophorou, James K. Olthoff, Yicheng Wang

Electron Interactions with CHF3

January 1, 1997

Author(s)

Loucas G. Christophorou, James K. Olthoff, MVVS. Rao

Economic analysis of research spillovers implications for the advanced technology program:

December 1, 1996

Author(s)

Adam B Jaffe

Mechanical Properties of Aluminum Nitride Substrates

December 1, 1996

Author(s)

Jay S. Wallace, Lin-Sien H. Lum

Aluminum nitride (AlN),because of its high thermal conductivity, is seeing increased use for heat management applications of semiconductor devices. With the