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NIST Pubs

Intramural comparison of NIST laser and optical fiber power calibrations

March 1, 2004

Author(s)

John H. Lehman, Igor Vayshenker, David J. Livigni, Joshua A. Hadler

The responsivity of two optical detectors was determined by the method of direct substitution in four different NIST measurement facilities. The measurements...

National Voluntary Laboratory Accreditation Program (NVLAP) Directory of Accredited Laboratories (2004 Edition)

February 27, 2004

Author(s)

Vanda R. White

The NVLAP Directory of Accredited Laboratories is published annually and provides a listing of laboratories accredited by the National Voluntary Laboratory...

Semiconductor Factory and Equipment Time Synchronization

February 25, 2004

Author(s)

Ya-Shian Li-Baboud, Brad Van Eck

With the advent of e-manufacturing including automated process control (APC), such as fault detection classification (FDC), more stringent accuracy requirements...

NIST HANDBOOK 150-2B National Voluntary Laboratory Accreditation Program Calibration Laboratories Technical Guide for Electromagnetic RF Microwave Measurements

February 21, 2004

Author(s)

C D. Faison, Carroll S. Brickenkamp

NIST HANDBOOK 150-2H National Voluntary Laboratory Accreditation Program Calibration Laboratories Technical Guide for Thermodynamic Measurements

February 21, 2004

Author(s)

C D. Faison, Carroll S. Brickenkamp

Workflow Automation in a B2B Web-Portal Testbed

February 10, 2004

Author(s)

Marjane Mabrouk, Frederic J. de Vaulx, Tom Rhodes

The work described in this report, focused on specifying and managing different steps of a Business-to-Business (B2B) workflow by developing and integrating a...

X-Ray Topography

February 4, 2004

Author(s)

David R. Black, Gabrielle G. Long

The study of the interrelationships between processing, structure and properties of materials is fundamental to the field of materials science and engineering...

Comparative Statistical Analysis of Test Parts Manufactured in Production Environments

February 2, 2004

Author(s)

David E. Gilsinn, Alice V. Ling

Estimating error uncertainties arising in production parts isnot a well understood process. This study developed an approach to estimatethese uncertainties...

Building and Fire Research Laboratory Activities, Accomplishments, and Recognitions 2003.

February 1, 2004

Author(s)

Kellie A. Beall, J E. Hill

This is the biennial report for 2002-2003 for the Building and Fire Research Laboratory (BFRL) at the National Institute of Standards and Technology (NIST), an...

Standards for Security Categorization of Federal Information and Information Systems

February 1, 2004

Author(s)

National Institute of Standards and Technology (NIST), Ronald S. Ross, Marianne M. Swanson

The purpose of this document is to provide a standard for categorizing federal information and information systems according to an agency's level of concern for...

Face Recognition Vendor Test 2002 Supplemental Report

February 1, 2004

Author(s)

Patrick J. Grother

Further analyses of the systems tested in the Face Recognition Vendor Test 2002 are reported. These supplement those covered in the primary Evaluation Report of...

Chemical Science and Technology Laboratory: Annual Report FY2003

February 1, 2004

Author(s)

W Koch, Eric B. Steel, Ellyn S. Beary

This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and...

NIST Recommended Rest Frequencies for Observed Interstellar Molecular Microwave Transitions -- 2002 Revision

February 1, 2004

Author(s)

Francis J. Lovas

Critically evaluated transition frequencies for the molecular transitions detected in interstellar and circumstellar clouds are presented. The tabulated...

DOM Test Suite Methodology

February 1, 2004

Author(s)

D Dimiradis

Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and...

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles

February 1, 2004

Author(s)

N G. Armstrong, W Kalceff, James Cline, John E. Bonevich

A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown...

Advanced Engineering Environments for Small Manufacturing Enterprises: Volume II

February 1, 2004

Author(s)

Steven J. Fenves, Ram D. Sriram, Young Choi, J P. Elm, J E. Robert

To assist the Small Manufacturing Enterprise (SME) in adopting Advanced Engineering Environments (AEEs), this report provides two self-assessment tools; the...

Computer Security Incident Handling Guide

January 16, 2004

Author(s)

Timothy Grance, Karen Kent, Brian Kim

[Superseded by SP 800-61 Rev. 1 (March 2008): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51289] NIST Special Publication 800-61, Computer...

The NIST 3 Megawatt Quantitative Heat Release Rate Facility

January 12, 2004

Author(s)

Rodney A. Bryant, Thomas J. Ohlemiller, Erik L. Johnsson, Anthony P. Hamins, B S. Grove, William F. Guthrie, Alexander Maranghides

The 3 Megawatt Heat Release Rate Facility was developed at NIST as a first step toward having broad capabilities for making quantitative large scale fire...

From Databooks to Online Dictionaries and Parts Catalogues

January 5, 2004

Author(s)

John V. Messina, James A. St Pierre

This power point presentation was presented at the 4th Annual ECCMA Membership Conference at Lehigh University on October 22nd, 2003 during a panel presentation...