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This document approves the XTS-AES mode of the AES algorithm by reference to IEEE Std 1619-2007, subject to one additional requirement, as an option for
Tsai Hong Hong, Elena R. Messina, Hui-Min Huang, Michael O. Shneier, Roger D. Eastman, Jane Shi, James Wells
The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology
The Blog track explores the information seeking behaviour in the blogosphere. The track was introduced in 2006 [1], with a main pilot search task, namely the
This report summarizes the work of the Complex Systems Program within NIST s Information Technology Laboratory. The Overview presents some background material
(1) Tbl 24-23-10-2-(1.35000)-d: Pg d-13500, New table for chloromethylsilanes for the condensed phases at one bar, or at equilibrium vapor pressure above the
George W. Arnold, David A. Wollman, Gerald FitzPatrick, Dean Prochaska, David Holmberg, David H. Su, Allen R. Hefner Jr., Nada T. Golmie, Tanya L. Brewer, Mark Bello, Paul A. Boynton
Under the Energy Independence and Security Act (EISA) of 2007, the National Institute of Standards and Technology (NIST) is assigned "primary responsibility to
Elaine B. Barker, Dennis K. Branstad, Santosh Chokhani, Miles E. Smid
On June 8 and 9, 2009, NIST held a Cryptographic Key Management (CKM) Workshop at its Gaithersburg, Maryland, campus that attracted approximately 80 people
In packet-based video transmissions, packets loss due to channel errors may result in the loss of the whole video frame. Recently, many error concealment
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100