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Journals

Small Angle Scattering Studies of Dendrimer Blends and Interpenetrating Polymer Networks

January 1, 1998

Author(s)

Barry J. Bauer, A Topp, T J. Prosa, Da-Wei Liu, C L. Jackson, Eric J. Amis

This report gives an overview about the first results of an investigation of mixtures that consist of dendrimers and conventional polymers. Poly[amido amine]

High Accuracy Aperture Area Measurement Facilities at the National Institute of Standards and Technology

January 1, 1998

Author(s)

J B. Fowler, R Durvasula, Albert C. Parr

The uncertainty in the measurement of aperture area can limit high-accuracy radiometric and photometric measurements. Relative total uncertainties in some

Comparison of Electron Density Measurements in Planar Inductively Coupled Plasmas by Means of the Plasma Oscillation Method and Lanqmuir Probes

January 1, 1998

Author(s)

A Schwabedissen, Eric C. Benck, J R. Roberts

The absolute, spatially resolved electron densities in planar inductively coupled plasmas have been measured by two different plasma diagnostic techniques, the

The Bose-Einstein condensate

January 1, 1998

Author(s)

Eric A. Cornell, C E. Wieman

In June 1995, our research group at the Joint Institute for Laboratory Astrophysics in Bolder, Colorado, succeeded in creating a miniscule but marvelous droplet

Ab Initio Inclusion of Electron-Hole Attraction: Application to X-Ray Absorption and Resonant Inelastic X-Ray Scattering

January 1, 1998

Author(s)

Eric L. Shirley

This work demonstrates a numerically feasible, yet realistic, calculational method for incorporating electron-core-hold interactions (Core-hole effects) in the

Absolute Silicon Photodiodes for 160 nm to 254 nm Photons

January 1, 1998

Author(s)

L R. Canfield, Robert E. Vest, R Korde, H Schmidtke, R Desor

Silicon n-on-p photodiodes with 100% internal efficiency have been studied in the 160 nm to 254 nm range. Preliminary values for the quantum yield of silicon, a

The New Cryogenic Vacuum Chamber and Blackbody Source for Infrared Calibrations at NIST's FARCAL Facility

January 1, 1998

Author(s)

J B. Fowler, Bettye C. Johnson, Joseph P. Rice, Steven R. Lorentz

The Facility for Advanced Radiometric Calibrations [FARCAL] at the National Institute of Standards and Technology [NIST] in Gaithersburg, MD currently comprises

New Ultraviolet Radiometry Beamline at the Synchrotron Ultraviolet Radiation Facility at NIST

January 1, 1998

Author(s)

Ping-Shine Shaw, Keith R. Lykke, Thomas R. O'Brian, Uwe Arp, H H. White, Thomas B. Lucatorto, J L. Dehmer, Albert C. Parr, R Gupta

We have constructed a new (UV) radiometry facility at the Synchrotron Ultraviolet Radiation Facility [SURF II] at the National Institute of Standards and

The Static Dielectric Constant of Liquid Water Between 274 and 418 K Near the Saturated Vapor Pressure

January 1, 1998

Author(s)

J O. Hamelin, J B. Mehl, Michael R. Moldover

The complex dielectric constant (relative electric permittivity) [epsilon] r = [epsilon]' - I[epsilon]'' of liquid water was redetermined in the temperature

Using Computers to Describe Style

January 1, 1998

Author(s)

Russell A. Kirsch

Human beings have a poorly understood ability to recognize patterns in their environment. Sometimes this ability is vital to survival. Sometimes it is the

SEAC and the Start of Image Processing at the National Bureau of Standards

January 1, 1998

Author(s)

Russell A. Kirsch

On the occasion of the 25th anniversary of Siggraph, it is useful to recall that computer processing of images began at the National Bureau of Standards (NBS

Rapidly Renewable Lap: Theory and Practice

January 1, 1998

Author(s)

Christopher J. Evans, R E. Parks, David J. Roderick, Michael L. McGlauflin

The rapidly renewable lap (RRL) uses a textured substrate over which thin films are slumped. The substrate provides the geometry of the lap and a localized

The Role of Space Charge in Scanned Probe Oxidation

January 1, 1998

Author(s)

John A. Dagata

The growth rate and electrical character of nanostructures produced by scanned probe oxidation are investigated by integrating an in-situ electrical force

Metrological Timelines in Traceability

January 1, 1998

Author(s)

S D. Rasberry, Charles D. Ehrlich

Current developments and applications in the field of metrology have increased the need for correct and appropriate usage of the terms and concepts related to

Inelastic Electron Scattering in Auger Electron Spectroscopy

January 1, 1998

Author(s)

R Shimizu, Cedric J. Powell

The International Union for Vacuum Science, Technique and Applications (IUVSTA) has established a workshop programme to provide a forum for intense scientific

Oxygen as a Surfactant in the Growth of Giant Magnetoresistance Spin Valves

January 1, 1998

Author(s)

P J. Chen, Cedric J. Powell, Mark D. Stiles, Robert McMichael, J Judy, K Takano, A Berkowitz

We have found a novel method for increasing the giant magnetoresistance (GMR) of Co/Cu spin valves with the use of oxygen. Surprisingly, spin valves with the

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

January 1, 1998

Author(s)

Robert McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.

The out-of-plane angular dependence of the ferromagnetic resonance linewidth, Δ H is described by nearly angle-independent damping parameters. In the NiO