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Journals

A CALORIMETRIC AND EQUILIBRIUM INVESTIGATION OF THE HYDROLYSIS OF LACTOSE

June 15, 1989

Author(s)

Robert N. Goldberg, Yadu D. Tewari

Effects of Doping-Density Gradients on Band-Gap Narrowing in Silicon and GaAs Devices

June 15, 1989

Author(s)

J R. Lowney, Herbert S. Bennett

New Compensation Method for Bulk Optical Sensors with Multiple Birefringences

June 1, 1989

Author(s)

W. G. Lee

Thermodynamic and Heat Transfer Implications of Working Fluid Mixtures in Rankine Cycles

June 1, 1989

Author(s)

R Radermacher

The theme of this article is to demonstrate the mutual influence of working fluid properties on the performance of Rankine cycles, heat transfer, and cycle

ELECTROCONFORMATIONAL COUPLING (ECC) - AN ELECTRIC-FIELD INDUCED ENZYME OSCILLATION FOR CELLULAR-ENERGY AND SIGNAL TRANSDUCTIONS

June 1, 1989

Author(s)

Adolfas K. Gaigalas, TY Tsong, D. Liu, F Chauvin, R D. Astumian

Comments on Spherical Near-Field Antenna Measurements

June 1, 1989

Author(s)

Ronald C. Wittmann

Numerical Aperture of Multimode Fibers by Several Methods: Resolving Differences

June 1, 1989

Author(s)

Douglas L. Franzen, M. Young, A. H. Cherin, E. D. Head, M. J. Hackert, K. Raine, J. Baines

Epitaxial Y-Ba-Cu-O thin films on MgO deposited by high-pressure reactive magnetron sputtering

May 30, 1989

Author(s)

Stephen E. Russek, K. Tanabe, D. K. Lathrop, R A. Buhrman

Electron-energy dependence of the S2F10 mass spectrum

May 4, 1989

Author(s)

James K. Olthoff, Richard J. VanBrunt, I. Sauers

Synthesis and Characterization of Novel Bonded Phases for Reversed-Phase HPLC

May 1, 1989

Author(s)

A. M. Stalcup, D. E. Martire, Lane C. Sander, Stephen Wise

A Machine-Learning Classification Approach for IC Manufacturing Control Based on Test Structure Measurements

May 1, 1989

Author(s)

Mona E. Zaghloul, D. Khera, Loren W. Linholm, C. P. Reeve

The Effect of an Electrically Large Stirrer in a Mode-Stirred Chamber

May 1, 1989

Author(s)

D. Wu, D. C. Chang

Spatial Filtering Microscope for Linewidth Measurements

April 15, 1989

Author(s)

M. Young

Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers

April 1, 1989

Author(s)

John G. Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues

Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and

Implementation of an Automated System for Measuring Radiated EMCssions Using a TEM cell

April 1, 1989

Author(s)

Galen H. Koepke, M T. Ma, W D. Bensema

Flux Creep and Activation Energies at the Grain Boundaries of Y-Ba-Cu-O Superconductors

April 1, 1989

Author(s)

M Nikolo, Ronald B. Goldfarb

Use of Thorium as a Target in Electron Spin Analyzers

April 1, 1989

Author(s)

Jabez J. McClelland, M Scheinfein, Daniel T. Pierce

Measurements of the effective Sherman function have been carried out for 10-100-keV spin-polarized electrons scattering from a thick thorium target in a

A 10 V Josephson Voltage Standard

April 1, 1989

Author(s)

Clark A. Hamilton, F. L. Lloyd, K. Chieh, K. Goeke

Evidence for the Superconducting Proximity Effect in Junctions between the Surfaces of YBa₂Cu₃O_x Thin Films

April 1, 1989

Author(s)

John M. Moreland, Ronald H. Ono, James A. Beall, M Madden, A. J. Nelson

PROPERTIES OF LASER-INDUCED GRATINGS IN EU-DOPED GLASSES

March 15, 1989

Author(s)

E G. Behrens, F M. Durville, R C. Powell, Douglas H. Blackburn

Infrared Absorption Cross Section of Arsenic in Silicon in the Impurity Band Region of Concentration

March 15, 1989

Author(s)

Jon C. Geist

THERMODYNAMICS OF HYDROLYSIS OF DISACCHARIDES - CELLOBIOSE, GENTIOBIOSE, ISOMALTOSE, AND MALTOSE

March 5, 1989

Author(s)

Yadu D. Tewari, Robert N. Goldberg

YBa2Cu3O7 thin films grown by high pressure reactive evaporation and high pressure reactivesputtering

March 1, 1989

Author(s)

Stephen E. Russek, D. K. Lathrop, K. Tanabe, R A. Buhrman

A high pressure reactive evaporation process and a high pressure reactive sputtering process have been developed for the growth of high quality thin films of